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PIDStudio PID操作軟件
- 公司名稱 束蘊(yùn)儀器(上海)有限公司
- 品牌 Freiberg Instruments
- 型號(hào) PIDStudio
- 產(chǎn)地 德國(guó)
- 廠商性質(zhì) 代理商
- 更新時(shí)間 2024/9/12 8:59:04
- 訪問(wèn)次數(shù) 804
電池片Pid測(cè)試儀電位誘導(dǎo)衰減(PID)Topcon電池Pid測(cè)試儀雙面電池Pid測(cè)試光伏電池Pid
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MicroCT,顯微CT,微焦點(diǎn)CT,骨骼成像,顯微CT材料學(xué)檢測(cè),微納顯微CT,X射線斷層掃描,TOC,元素檢測(cè)
價(jià)格區(qū)間 | 面議 | 應(yīng)用領(lǐng)域 | 醫(yī)療衛(wèi)生,環(huán)保,食品,化工,能源 |
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PID操作軟件PIDStudio是一個(gè)很*的軟件,它非常容易操作和直觀,因?yàn)樗鶕?jù)我們用戶的反饋持續(xù)更新和改進(jìn)。
通過(guò)PIDStudio,可以輸出和比較多個(gè)測(cè)量的下列參數(shù):
● 并聯(lián)電阻
● 電導(dǎo)率
● 功率損耗
● 泄漏電流
● 溫度
● 濕度
● 高電壓
PID操作軟件主要特點(diǎn):
● 用戶結(jié)構(gòu)
● 輸出功能
● 譜圖
● 通過(guò)和失敗標(biāo)準(zhǔn)
● 分析功能包
● 可控制任意數(shù)量的設(shè)備
參考文獻(xiàn): cells (1)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Local corrosion of silicon as root cause for potential induced degradation at the rear side of bifacial PERC solar cells. physica status solidi (RRL)–Rapid Research Letters. 2019, doi 10.1002/pssr.201900163
(2)V. Naumann, K. Ilse, M. Pander, J. Tr?ndle, K. Sporleder, C. Hagendorf, Influence of soiling and moisture ingress on long term PID susceptibility of photovoltaic
modules, AIP Conference Proceedings 2147, 090005 (2019).
(3)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Root cause analysis on corrosive potential-induced degradation effects at the rear side of bifacial silicon PERC solar cells, Solar Energy Materials and Solar Cells 201, 110062 (2019).
(4)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells
as Root Cause of Potential‐Induced Degradation at the Rear Side, Phys. Status Solidi A (2019), doi:10.1002/pssa.201900334.
(5)K. Sporleder, J. Bauer, S. Gro?er, S. Richter, A. H?hnel, M. Turek, V. Naumann, K. Ilse, C. Hagendorf, Potential-Induced Degradation of Bifacial PERC Solar Cells Under Illumination, IEEE Journal of Photovoltaics 9 (6) 1522-1525, 2019.
(6)K. Sporleder, M. Turek, N. Schüler, V. Naumann, D. Hevisov, C. P?blau, S. Gro?er, H. Schulte-Huxel, J. Bauer, C. Hagendorf, Quick test for reversible and irreversible PID of bifacial PERC solar cells, Solar Energy Materials and Solar Cells 219, 110755, 2021.
(7)K. Sporleder, V. Naumann, J. Bauer, D. Hevisov, M. Turek, and C. Hagendorf, Time-resolved Investigation of Transient Field Effect Passivation States during Potential Induced Degradation and Recovery of Bifacial Silicon Solar Cells , Solar RRL, 2021, accepted.