WCT testers showcase our unique measurement and analysis techniques, including the highly regarded Quasi-Steady-State Photoconductance （QSSPC） lifetime measurement method developed by Sinton Instruments in 1994.

The QSSPC technique is ideal for monitoring multicrystalline wafers, dopant diffusions, and low-lifetime samples. This method complements the use of the transient photoconductance technique that is also standard on this instrument.

The QSSPC lifetime measurement also yields the implied open-circuit voltage （versus illumination） curve, which is comparable to an I-V curve at each stage of a solar cell process.

WCT System Capabilities

Primary application:

Step-by-step monitoring and optimization of a fabrication process.

Other applications:

Sinton Instruments' analysis yields a calibrated carrier injection level for each wafer, so you can interpret lifetime data in a physically precise way. Specific parameters of interest are displayed and logged for each measurement.


• Monitoring initial material quality

• Detecting heavy metals contamination during wafer processing

• Evaluating surface passivation and emitter dopant diffusion

• Evaluating process-induced shunting using the implied I-V measurement

Further Information

技術(shù)參數(shù)：
FAQ:

• What is the recombination lifetime?

• How does the solar cell efficiency depend on the lifetime?

• What determines the lifetime in silicon?

• How is lifetime measured by the Sinton Instruments tools?

• How is the data analyzed?

• Can you measure surface recombination velocity?

• Does the system measure emitter saturation current density?

• Can wafers be measured with no surface passivation （“out of the box”）?

• Can any of these instruments do lifetime maps?

• How do these measurements compare to microwave PCD?

• What lifetimes can be measured?

• What is the smallest sample size?

• How do you measure bulk lifetime on blocks or ingots?

• At what carrier density should I report the result?

• Can the lifetime tester be used to detect Fe contamination?

• How is the instrument calibrated?

• When should wafers be tested inline?

• Does the lifetime tester measure the trapping?
　
Module and Cell Flash Testers frequently asked questions

主要特點(diǎn)：

常見問題：

WT-2000與WCT-120測少子壽命的差異？

WCT用的是Quasi-Steady-State Photoconductance（QSSPC準(zhǔn)穩(wěn)態(tài)光電導(dǎo)）而WT2000是微波光電導(dǎo)。

WCT-120/100準(zhǔn)穩(wěn)態(tài)光電導(dǎo)法測少子壽命的原理？

WCT用的是Quasi-Steady-State Photoconductance（QSSPC準(zhǔn)穩(wěn)態(tài)光電導(dǎo)）