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          上海巨納科技有限公司>>二維材料>>二維材料薄膜>>機(jī)械剝離單層二硫化鉬薄膜

          機(jī)械剝離單層二硫化鉬薄膜

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          供貨周期 一周    
          Monolayer molybdenum disulfide (1H-MoS?) flakes have been exfoliated from bulk molybdenum disulfide (2H-MoS?) onto 90nm thermal oxide and measures from 5 micron up to 40 micron in size.

          詳細(xì)介紹

          Monolayer molybdenum disulfide (1H-MoS?) flakes have been exfoliated from bulk molybdenum disulfide (2H-MoS?) onto 90nm thermal oxide and measures from 5 micron up to 40 micron in size. Each sample contains at least one single-layer MoS? and is easy to find with the given x and y coordinates. Optical images and preliminary tests come with the product. Typically, single-layer MoS? show strong PL at 1.85-1.88 eV with 0.04 to 0.1eV FWHM, and the Raman peaks are located at 386cm-1 (E2g in-plane mode) and 404 cm-1 (A1g out-of-plane mode). Characterization Raman spectroscopy: Raman spectroscopy is data is taken on every single-layer flakes. Typically, flakes show two prominent Raman peaks at 386cm-1 (E2g- in plane-) and 404cm-1 (A1g out-of-plane) and the FWHM (full-width-at-half-maximum) is less than 5cm-1. Photoluminescence (PL): In the single layer form, molybdenum disulfide possesses direct band-gap at 1.85eV (670nm). PL measurements show strong PL peak located at 1.85eV (670nm) with 0.04-0.10 eV PL FWHM. Optical Microscope images: Each sample is inspected under the optical microscope and x-y coordinates are recorded. Contact us for more information

          Possible applications:
          Electronics
          Sensors - detectors
          Optics
          STM – AFM applications
          Molecular detection – binding
          Ultra-low friction studies
          Materials science and semiconductor research

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