sciventions為科學(xué)家們提供一個(gè)銷售平臺(tái),銷售他們開發(fā)的沒有正式商品化的產(chǎn)品和因包裝太小而被單獨(dú)分離出來的產(chǎn)品,產(chǎn)品包括:納米粒子,AFM探針,聚苯乙烯粒子,高束縛表面用于ELISA實(shí)驗(yàn)的96微孔板(U型)。并提供相應(yīng)的掃描電鏡的圖片
Description: Silicon AFM probes are designed for contact mode applications. These probes feature shorter cantilevers, which provide better sensitivity without compromising on spring constant requirements. 5 AFM Tips per pack.
Material : N-type Silicon
Cantilevel Geometry :Pyramidal
Cantilever Number : 1
Cantilever Thickness : 1 µm
Back Side Coating: None
Top Layer Coating: None
| Each tip contains 1 caivers with the following properties: Tip | Shape | Length | Width | Force Const. | Res. Freq. | Tip Raidus | 1 | Pyramidal | 225 µm | 43 µm | 0.10 N/m | 28 kHz | 6 nm | |