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介電常數(shù)測(cè)試儀參數(shù)
閱讀:2293發(fā)布時(shí)間:2015-1-14
介電常數(shù)介質(zhì)損耗測(cè)試儀電感器:
The dielectric constant, dielectric loss tester inductor:
按測(cè)試頻率要求,需要配置不同量的電感器。
According to the test frequency requirements, need different amounts of inductor configuration.
例如:在1MHz測(cè)試頻率時(shí),要配250μH電感器,在50MHz測(cè)試頻率時(shí),要配0.1μH電感器等。
For example: in the 1MHz test frequency, the allocation will be 250 mu H inductor,in the 50MHz test frequency, the allocation will be 0.1 mu H inductors.
高頻介質(zhì)樣品(選購(gòu)件):
High frequency dielectric samples (optional):
在現(xiàn)行高頻介質(zhì)材料檢定系統(tǒng)中,檢定部門為高頻介質(zhì)損耗測(cè)量?jī)x提供的測(cè)量標(biāo)準(zhǔn)是高頻標(biāo)準(zhǔn)介質(zhì)樣品。
In the current high frequency dielectric material test system, verification departmentfor measurement standards provide high frequency dielectric loss measuring instrument is high frequency standard media sample.
該樣品由人工藍(lán)寶石,石英玻璃,氧化鋁陶瓷,聚四氟乙烯,環(huán)氧板等材料做成Φ50mm,厚1~2mm測(cè)試樣品。用戶可按需訂購(gòu),以保證測(cè)試裝置的重復(fù)性和準(zhǔn)確性。
The sample consists of artificial sapphire, quartz glass, alumina ceramics, PTFE,epoxy board and other materials made of diameter 50mm, thickness 1 ~ 2mm test sample. The user can according to need to order, to ensure the repeatability and accuracy of the test device.
介電常數(shù)介質(zhì)損耗測(cè)試儀特點(diǎn):
The dielectric constant, dielectric loss tester features:
◎ 本公司創(chuàng)新的自動(dòng)Q值保持技術(shù),使測(cè)Q分辨率至0.1Q,使tanδ分辨率至0.00005 。
Automatic Q \ \ the company innovation value keeping technology, enabling the measurement resolution of Q to 0.1Q, the tan delta resolution to 0.00005.
◎ 能對(duì)固體絕緣材料在10kHz~120MHz介質(zhì)損耗角(tanδ)和介電常數(shù)(ε)變化的測(cè)試。
The energy of solid insulating materials in dielectric loss angle of 10kHz ~ 120MHz(tan delta) and Permittivity (epsilon) change test.
◎ 調(diào)諧回路殘余電感值低至8nH,保證100MHz的(tanδ)和(ε)的誤差較小。
The tuning circuit residual inductance values as low as 8nH, ensure that 100MHz(tan delta) and (E) the error is small.
◎ 特制LCD屏菜單式顯示多參數(shù):Q值,測(cè)試頻率,調(diào)諧狀態(tài)等。
Multi parameter \ \ a special LCD screen menu display: Q value, the test frequency,the tuning status.
◎ Q值量程自動(dòng)/手動(dòng)量程控制。
The Q value range automatic / manual range control.
◎ DPLL合成發(fā)生1kHz~60MHz, 50kHz~160MHz測(cè)試信號(hào)。獨(dú)立信號(hào) 源輸出口,所以本機(jī)又是一臺(tái)合成信號(hào)源。
The DPLL synthesis occurs 1kHz ~ 60MHz, 50kHz ~ 160MHz test signal.Independent signal source output port, so the machine is a synthetic signal source.
◎ 測(cè)試裝置符合國(guó)標(biāo)GB/T 1409-2006,美標(biāo)ASTM D150以及IEC60250規(guī)范要求。
The test device to meet the national standard GB/T 1409-2006, ASTM D150 and IEC60250 specifications American Standard.
介電常數(shù)和介質(zhì)損耗測(cè)試儀工作頻率范圍是10kHz~120MHz,它能完成工作頻率內(nèi)材料的高頻介質(zhì)損耗角(tanδ)和介電常數(shù)(ε)變化的測(cè)試。
The dielectric constant and dielectric loss tester operating frequency range is 10kHz ~ 120MHz, it can complete the working frequency of high frequency dielectric loss angle within (tan delta) and Permittivity (epsilon) change test.
本儀器中測(cè)試裝置是由平板電容器和測(cè)微圓筒線性電容器組成,平板電容器一般用來夾被測(cè)樣品,配用Q表作為指示儀器。
The instrument testing device is composed of a parallel plate capacitor and a micrometer cylinder linear capacitors, capacitor plate is generally used to clamp the sample, equipped with the Q table as indicating instrument.
絕緣材料的損耗角正切值是通過被測(cè)樣品放入平板電容器和不放樣品的Q值變化和厚度的刻度讀數(shù)通過公式計(jì)算得到。
Insulating material loss angle tangent value is calculated by the formula of scale reading through the measured sample into a flat capacitor and lofting products of Q value change and the thickness of the obtained.
同樣,由測(cè)微圓筒線性電容器的電容量讀數(shù)變化,通過公式計(jì)算得到介電常數(shù)。
Similarly, capacitance micrometer readings by change of cylindrical linearcapacitors, to obtain the dielectric constant calculated by the formula.
介電常數(shù)介質(zhì)損耗測(cè)試儀主要技術(shù)指標(biāo):
The main technical indexes of the dielectric constant of dielectric loss tester:
2.1 tanδ和ε性能:
2.1 tan delta and epsilon performance:
2.1.1 固體絕緣材料測(cè)試頻率10kHz~120MHz的tanδ和ε變化的測(cè)試。
2.1.1 solid insulating materials testing frequency of 10kHz ~ tan delta and epsilonchanges in 120MHz test.
2.1.2 tanδ和ε測(cè)量范圍:
2.1.2 tan delta and epsilon measurement range:
tanδ:0.1~0.00005,ε:1~50
Tan delta: 0.1 ~ 0.00005, epsilon: 1 ~ 50
2.1.3 tanδ和ε測(cè)量精度(1MHz):
2.1.3 tan delta and epsilon measurement precision (1MHz):
tanδ:±5%±0.00005,ε:±2%
Tan delta: + 5% + 0.00005, + 2% epsilon:
工作頻率范圍:50kHz~50MHz 四位數(shù)顯,壓控振蕩器
Frequency range: 50kHz ~ 50MHz four digits, voltage controlled oscillator
Q值測(cè)量范圍:1~1000三位數(shù)顯,±1Q分辨率
Q value measuring range: 1 ~ 1000 three digit display, plus or minus 1Q resolution
可調(diào)電容范圍:40~500 pF ΔC±3pF
Adjustable capacitance range: 40 ~ 500 pF Delta C + 3pF
電容測(cè)量誤差:±1%±1pF
Capacitance measurement error: + 1% + 1pF
Q表殘余電感值:約20nH
Residual inductance Q table: about 20nH
介電常數(shù)介質(zhì)損耗測(cè)試儀裝置:
The dielectric constant, dielectric loss tester:
2.3.1 平板電容器極片尺寸::Φ38mm和Φ50mm二種.
2.3.1 plate capacitor pole piece size: diameter 38mm and a 50mm of two.
2.3.2 平板電容器間距可調(diào)范圍和分辨率:0~8mm, ±0.01mm
2.3.2 capacitor plate spacing adjustable range and resolution: 0 ~ 8mm, + 0.01mm
2.3.3 圓筒電容器線性: 0.33 pF /mm±0.05 pF,
2.3.3 cylindrical capacitor linear: 0.33 pF /mm + 0.05 pF,
2.3.4 圓筒電容器可調(diào)范圍:±12.5mm(±4.2pF)
2.3.4 cylindrical capacitor adjustable range: + 12.5mm (+ 4.2pF)
2.3.5 裝置插頭間距:25mm±0.1mm
2.3.5 device plug spacing: 25mm + 0.1mm
2.3.6 裝置損耗角正切值:≤2.5×10-4
2.3.6 device loss tangent: less than 2.5 * 10-4
標(biāo)簽:
介電常數(shù)測(cè)試儀
介電常數(shù)介質(zhì)損耗測(cè)試儀
介質(zhì)損耗因數(shù)測(cè)試儀
介電常數(shù)和介質(zhì)損耗測(cè)試儀
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